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Fault Diagnosis Engineering of Digital Circuits Can Identify Vulnerable Molecules in Complex Cellular Pathways

Ali Abdi1, Mehdi Baradaran Tahoori2, and Effat S. Emamian3*†

1Center for Wireless Communications and Signal Processing Research, Department of Electrical and Computer Engineering, New Jersey Institute of Technology, 323 King Boulevard, Newark, NJ 07102, USA.

2Department of Electrical and Computer Engineering, Northeastern University, 307 Dana Research Building, Boston, MA 02115, USA.

3Advanced Technologies for Novel Therapeutics (ATNT), 211 Warren Street Newark, NJ 07103, USA.

†Work initiated at The Rockefeller University, Box 296, 1230 York Avenue, New York, NY 10021, USA.

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Publication Details

Submitted:26 August 2008

Accepted: 06 October 2008

Published online: 16 October 2008 as 10.1126/scisignal.2000008

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Final publication: 21 October 2008, volume 1, issue 42, page ra10

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*To whom correspondence should be addressed: E-mail: emame{at}ATNT-USA.com

Citation: A. Abdi, M. B. Tahoori, E. S. Emamian, Fault Diagnosis Engineering of Digital Circuits Can Identify Vulnerable Molecules in Complex Cellular Pathways. Sci. Signal.1, ra10 (2008).

© 2008 American Association for the Advancement of Science